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[New Product] PLC terminal block compatible with KEYENCE KV Nano input/output units with combined common terminal block
Part Number
Configured Part Number is shown.
MWS-M34T40-KV
■ Compatible Models
KV-5500 Series
Expansion unit
KV-C32TC/C32TD/C32TCP/C32TA
KV-C64TC/C64TD/C64XC/C64XA/C64TA/KV-C64TCP/KV-C16XTD
KV-C32XTD/C32XC/C32XA
KV Nano Series
Expansion unit
KV-NC32EX/NC32ET/NC16EXT
Other units that share the same registration printing can be used.
■ Built-in connector
■ Conforming Crimp Terminal
■ Name Plate Image
■ Recommended harnesses:
HIFS-SS-□□-34-(length)
Specifications
Rated Voltage | 125 VAC, VDC |
Rated Current | 1 A |
Withstand Voltage | 500 VAC for 1 min. |
Insulation Resistance | 1,000 MΩ or more (500 VDC) |
Terminal screw | M3 (Screw Hold Mechanism with Spring) |
Tightening Torque | 0.8 N/m max |
Applicable Wire | AWG 22 to 16 |
Pitch Between Terminals | 7 mm |
Ambient Temperature Range | -40°C to +80°C |
Terminal Block | PBT (G15) |
Case | PC |
Substrate | Glass Epoxy (FR4) |
Male Screw | Steel, Zn plating |
Female screw | Brass, Sn plating |
Part Number |
---|
MWS-M34T40-KV |
Part Number | Standard Unit Price | Minimum order quantity | Volume Discount | Days to Ship |
---|---|---|---|---|
SGD 46.96 | 1 Piece(s) | Available | Same day |
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Connector | MIL connector | Terminal Block Screw | M3 | Number of connector cores(Pole) | 40 |
---|---|---|---|---|---|
Mounting Method | DIN rail/Direct attachment | Pitch Between Terminals(mm) | 7 | Supported equipment | PLC |
Supported equipment manufacturer | Keyence | Dimension vertical(mm) | 42 | Dimension width(mm) | 145.5 |
Dimension depth(mm) | 51 | Supported crimp terminal | Y Terminal / Round Terminal | Number of terminal block electrodes(Pole) | 40 |
Registering Plate | COM/signal | Connector Polarity (Mounted Connector) | Female | Terminal block screw type | Spring Up |
Multi-Function Type | +CCM terminal |
Please check the type/dimensions/specifications of the part MWS-M34T40-KV in the '+com PLC Connector Terminal Block (for KEYENCE KV, KV Nano) series.
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How can we improve?